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In-situ electron microscopy
TEM in-situ solutions
Spring Series In-Situ Holders
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SEM in-situ solutions
Spring Series In-Situ Stages
Breeze Series In-Situ Stages
Volcano Series In-Situ Stages
Gravity Series In-Situ Stages
Glacier Series Stages
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Single-Tilt Tomography Holders
On-Axis Rotation Tomography Holders（Automatic Full Angle）
Multiple Samples Holders（4 Holes)
Air-Free Transfer holders
Double-tilt Holders（GRID）
SEM Vacuum Transfer Chamber
High Vacuum Storage Instrument for Sample Holders
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Spring Series In-Situ Stages（Electrochemistry)
Through MEMS chips to apply electrical signals to thin-layer or nano-battery systems, combined with a variety of different modes such as EDS, real-time and dynamic monitoring of key information such as microstructure evolution, reaction dynamics, phase transformation, chemical changes, surface/interface structure and composition evolution at the nano level can be achieved.
The two-dimensional planar imaging information of the sample is obtained through a series of different tilt angles, and the three-dimensional imaging information can be obtained by using software processing. Direct observation with 3mm copper mesh samples supports high-resolution analysis with high-angle toroidal Dark field imaging (HAADF-STEM) in scanning transmission mode.
On-Axis Rotation Tomography Holders
Upgraded on the basis of the common 3D reconstructed sample rod, the bullet head single axis 360° rotation method is used to obtain more 2D imaging information of the sample at all angles, and avoid the loss of the information of the wedge-shape.
The ultimate vacuum of the NanoVizo High vacuum holder is 10-6 hPa, which can provide a high vacuum storage environment for up to 6 TEM sample rods at the same time, avoid exposure to impurities such as moisture and nanofibers in the air, reduce the vacuum time of the sample rod after entering the electron microscope, extend the service life of the sample rod, and greatly improve the efficiency of the laboratory.
It can ensure that sensitive samples such as lithium batteries, which are easy to react with water and oxygen in the air, do not contact the air during the transfer from the glove box to the electron microscope, and maintain the original state of the sample to avoid oxidation or internal structure changes.
Porous Silicon Nitride Grid
Porous silicon nitride TEM carrier mesh is based on high-purity monocrystalline silicon and ultra-thin silicon nitride (10-50nm) as the supporting film. It adopts ultra-high temperature coating technology and has the characteristics of low stress corrosion resistance and radiation resistance. It can achieve atomic resolution, especially suitable for atomic resolution characterization under spherical aberration electron microscopy, and is very convenient for transfer analysis between different analytical instruments. Such as TEM, AFM, XRD, EXAFS, Raman, etc.
Static Liquid Cell
The upper and lower chips are formed into a Liquid Cell by bonding the inner seal and epoxy resin outer seal. EDS, EELS, SAED, HRTEM, STEM and other different modes are combined in TEM. The key information such as microstructure evolution, reaction kinetics, phase transition, element valence, chemical change, microscopic stress, and atomic structure and composition evolution at the surface/interface of the sample in the liquid atmosphere can be monitored in real time and even at the atomic level.
Multiple Samples Holders(4 Holes)
Up to 4 samples can be simultaneously placed into a transmission electron microscope, which significantly improves the efficiency of transmission electron microscopy compared to the commonly seen 3-hole sample rods on the market. The new structural design and ultra high precision knob replacement method help reduce drift rate and improve imaging quality.
